Yves Surrel: search on Z-Library

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1

Phase-locked optical metrology I: identification of intrinsic camera parameters from multiple grid views

Journal:

Year:

2018

Language:

english

File:

PDF, 931 KB

english, 2018

2

Diffraction grating interferometers for mechanical characterisations of advanced fabric laminates

Jung-Ryul Lee, Jérôme Molimard, Alain Vautrin, Yves Surrel

Journal:

Optics & Laser Technology

Year:

2006

Language:

english

File:

PDF, 1.11 MB

english, 2006

3

A full-field optical method for the experimental analysis of reinforced concrete beams repaired with composites

Stéphane Avril, Emmanuel Ferrier, Alain Vautrin, Patrice Hamelin, Yves Surrel

Journal:

Composites Part A: Applied Science and Manufacturing

Year:

2004

Language:

english

File:

PDF, 763 KB

english, 2004

4

SPIE Proceedings [SPIE Speckle06: Speckles, From Grains to Flowers - Nimes, France (Wednesday 13 September 2006)] Speckle06: Speckles, From Grains to Flowers - Absolute flatness measurement with 10 nm resolution over a 400 mm field

Surrel, Yves, Slangen, Pierre, Cerruti, Christine

Year:

2006

Language:

english

File:

PDF, 212 KB

english, 2006

5

Phase shifting: six-sample self-calibrating algorithm insensitive to the second harmonic in the fringe signal

Journal:

Optical Engineering

Year:

1995

Language:

english

File:

PDF, 54 KB

english, 1995

6

Design of algorithms for phase measurements by the use of phase stepping

Journal:

Year:

1996

Language:

english

File:

PDF, 251 KB

english, 1996

7

Extended averaging and data windowing techniques in phase-stepping measurements: an approach using the characteristic polynomial theory

Journal:

Optical Engineering

Year:

1998

Language:

english

File:

PDF, 120 KB

english, 1998

8

Phase-shifting algorithms for nonlinear and spatially nonuniform phase shifts: comment

Journal:

Journal of the Optical Society of America A

Year:

1998

Language:

english

File:

PDF, 242 KB

english, 1998

9

SPIE Proceedings [SPIE International Conference on Interferometry '94 - Warsaw, Poland (Monday 16 May 1994)] Interferometry '94: Photomechanics - Moire and grid methods: a signal-processing approach

Surrel, Yves, Pryputniewicz, Ryszard J., Stupnicki, Jacek

Year:

1994

Language:

english

File:

PDF, 641 KB

english, 1994

10

SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Interferometry XII: Techniques and Analysis - Massively parallel interferometry: towards the all-integrated lambdameter

Fodor, Jozsua, Creath, Katherine, Schmit, Joanna, Garcia-Marquez, Jorge, Surrel, Yves

Year:

2004

Language:

english

File:

PDF, 196 KB

english, 2004

11

SPIE Proceedings [SPIE Lasers, Optics, and Vision for Productivity in Manufacturing I - Besancon, France (Monday 10 June 1996)] Optical Inspection and Micromeasurements - Displacement field measurement in the nanometer range

Surrel, Yves, Fournier, Nicolas, Gorecki, Christophe

Year:

1996

Language:

english

File:

PDF, 1.40 MB

english, 1996

12

SPIE Proceedings [SPIE International Conference on Applied Optical Metrology - Balatonfured, Hungary (Monday 8 June 1998)] International Conference on Applied Optical Metrology - Design of algorithms for phase measurement

Surrel, Yves, Rastogi, Pramod K., Gyimesi, Ferenc

Year:

1998

Language:

english

File:

PDF, 271 KB

english, 1998

13

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - Seattle, WA (Sunday 7 July 2002)] Interferometry XI: Applications - Application of grating shearography to the experimental analysis of a single fabric lamina under tensile loading

Lee, Jong-Ryul, Molimard, Jerume, Vautrin, Alain, Surrel, Yves, Osten, Wolfgang

Year:

2002

Language:

english

File:

PDF, 365 KB

english, 2002

14

SPIE Proceedings [SPIE SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 11 July 1993)] Interferometry VI: Techniques and Analysis - Phase stepping: application to high-resolution moire

Surrel, Yves, Zhao, Bing, Kwon, Osuk Y., Brown, Gordon M., Kujawinska, Malgorzata

Year:

1993

Language:

english

File:

PDF, 797 KB

english, 1993

15

Design of phase-detection algorithms insensitive to bias modulation

Journal:

Year:

1997

Language:

english

File:

PDF, 259 KB

english, 1997

16

Additive noise effect in digital phase detection

Journal:

Year:

1997

Language:

english

File:

PDF, 302 KB

english, 1997

17

SPIE Proceedings [SPIE Lasers and Optics in Manufacturing III - Munich, Germany (Monday 16 June 1997)] Optical Inspection and Micromeasurements II - Two-step temporal phase unwrapping in profilometry

Surrel, Yves, Gorecki, Christophe

Year:

1997

Language:

english

File:

PDF, 509 KB

english, 1997

18

Plastic behaviour of fibrous laminae

Yves Surrel, Alain Vautrin

Journal:

Composites Science and Technology

Year:

1993

Language:

english

File:

PDF, 455 KB

english, 1993

19

SPIE Proceedings [SPIE SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 11 July 1993)] Interferometry VI: Techniques and Analysis - Phase stepping: application to the automated determination of isostatics in photoelasticimetry

Surrel, Yves, Kwon, Osuk Y., Brown, Gordon M., Kujawinska, Malgorzata

Year:

1993

Language:

english

File:

PDF, 1.03 MB

english, 1993

20

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - Seattle, WA (Sunday 7 July 2002)] Interferometry XI: Techniques and Analysis - Some metrological issues in optical full-field techniques

Surrel, Yves, Creath, Katherine, Schmit, Joanna

Year:

2002

Language:

english

File:

PDF, 227 KB

english, 2002

21

Effect of quantization error on the computed phase of phase-shifting measurements

Zhao, Bing, Surrel, Yves

Journal:

Year:

1997

Language:

english

File:

PDF, 252 KB

english, 1997

22

SPIE Proceedings [SPIE International Conference on Interferometry '94 - Warsaw, Poland (Monday 16 May 1994)] Interferometry '94: Photomechanics - Simultaneous u-v displacement field measurement with a phase-shifting grid method

Surrel, Yves, Zhao, Bing, Pryputniewicz, Ryszard J., Stupnicki, Jacek

Year:

1994

Language:

english

File:

PDF, 778 KB

english, 1994

23

SPIE Proceedings [SPIE International Conference on Optical Metrology - Pultusk Castle, Poland (Wednesday 20 October 1999)] Interferometry '99: Techniques and Technologies - Grating shearography

Bulhak, Jacek, Surrel, Yves, Kujawinska, Malgorzata, Takeda, Mitsuo

Year:

1999

Language:

english

File:

PDF, 1.67 MB

english, 1999

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